OverviewBruker’s Nano Surface and Metrology (BNSM) Division is the leader in advanced X-ray, AFM, and other various metrology products, including the semiconductor IC and compound semiconductor industries. The BNSM division offers the most comprehensive portfolio of
Overview Bruker’s Nano Surface and Metrology (BNSM) Division is the leader of advanced X-ray, AFM, and other various metrology products for semiconductor IC and compound semiconductor industries. The BNSM division offers the most comprehensive portfolio of